Invention Grant
- Patent Title: Methods and devices for high performance consistency check
- Patent Title (中): 用于高性能一致性检查的方法和设备
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Application No.: US12186981Application Date: 2008-08-06
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Publication No.: US07971092B2Publication Date: 2011-06-28
- Inventor: Kapil Sundrani
- Applicant: Kapil Sundrani
- Applicant Address: US CA Milpitas
- Assignee: LSI Corporation
- Current Assignee: LSI Corporation
- Current Assignee Address: US CA Milpitas
- Agency: Duft Bornsen & Fishman LLP
- Main IPC: G06F11/00
- IPC: G06F11/00

Abstract:
Methods and devices for reading data from a plurality of storage devices belonging to a plurality of spans and checking consistency (e.g., XOR parity check) of data belonging to each span independently of another span in one embodiment. Methods and devices for reading data from a plurality of stripes and checking consistency of the data from the plurality of stripes in another embodiment.
Public/Granted literature
- US20100037019A1 METHODS AND DEVICES FOR HIGH PERFORMANCE CONSISTENCY CHECK Public/Granted day:2010-02-11
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