Invention Grant
- Patent Title: Enhanced statistical measurement analysis and reporting
- Patent Title (中): 增强的统计测量分析和报告
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Application No.: US11457653Application Date: 2006-07-14
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Publication No.: US07971181B2Publication Date: 2011-06-28
- Inventor: Steven E. Pabalate , Jeffrey R. Amspaugh , Christine M. Rebok , Brian S. Birtell , Robert P. Sarlo
- Applicant: Steven E. Pabalate , Jeffrey R. Amspaugh , Christine M. Rebok , Brian S. Birtell , Robert P. Sarlo
- Applicant Address: IE Dublin
- Assignee: Accenture Global Services Limited
- Current Assignee: Accenture Global Services Limited
- Current Assignee Address: IE Dublin
- Agency: Fish & Richardson P.C.
- Main IPC: G06F9/44
- IPC: G06F9/44

Abstract:
Project information relating to a project is received, the project information identifying a project type, an authorized write entity, and an authorized approval entity, and a valid metric is selected based at least on the project type, the valid metric measuring an aspect of performance of the project. Base measures corresponding to the valid metric are received from the authorized write entity, the base measures further including periodic base measures corresponding to at least one metric period, and aperiodic base measures corresponding to an aperiodic incident, and the valid metric is calculated based on the base measures. The base measures are sorted into excluded base measures and non-excluded base measures, organizational baseline data is imported, and an organizational indicator is calculated based on the non-excluded base measures and the organizational baseline data.
Public/Granted literature
- US20080016490A1 Enhanced Statistical Measurement Analysis and Reporting Public/Granted day:2008-01-17
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