Invention Grant
US07971627B2 Device for producing metal sample and process for producing metal sample 有权
用于生产金属样品的设备和生产金属样品的方法

  • Patent Title: Device for producing metal sample and process for producing metal sample
  • Patent Title (中): 用于生产金属样品的设备和生产金属样品的方法
  • Application No.: US11996682
    Application Date: 2006-06-30
  • Publication No.: US07971627B2
    Publication Date: 2011-07-05
  • Inventor: Yasuji Kawashima
  • Applicant: Yasuji Kawashima
  • Applicant Address: JP Osaka
  • Assignee: Panasonic Corporation
  • Current Assignee: Panasonic Corporation
  • Current Assignee Address: JP Osaka
  • Agency: Wenderoth, Lind & Ponack, L.L.P.
  • Priority: JP2005-216716 20050727
  • International Application: PCT/JP2006/313051 WO 20060630
  • International Announcement: WO2007/013256 WO 20070201
  • Main IPC: B22D46/00
  • IPC: B22D46/00 G01N1/12
Device for producing metal sample and process for producing metal sample
Abstract:
A process and a device for easily and rapidly producing a metal sample for analysis for determining the content of impurities in a molten metal with high accuracy. More particularly, according to the metal sample production process, a metal sample for high accuracy analysis is produced by solidifying a collected molten metal without segregating impurities contained in a molten metal, by rapidly cooling a collected molten metal using a metal sample production device having a thin-walled mold having a thin sample collection space for collecting a molten metal, and an opening/closing operation part with which the mold can be freely opened/closed.
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