Invention Grant
US07971627B2 Device for producing metal sample and process for producing metal sample
有权
用于生产金属样品的设备和生产金属样品的方法
- Patent Title: Device for producing metal sample and process for producing metal sample
- Patent Title (中): 用于生产金属样品的设备和生产金属样品的方法
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Application No.: US11996682Application Date: 2006-06-30
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Publication No.: US07971627B2Publication Date: 2011-07-05
- Inventor: Yasuji Kawashima
- Applicant: Yasuji Kawashima
- Applicant Address: JP Osaka
- Assignee: Panasonic Corporation
- Current Assignee: Panasonic Corporation
- Current Assignee Address: JP Osaka
- Agency: Wenderoth, Lind & Ponack, L.L.P.
- Priority: JP2005-216716 20050727
- International Application: PCT/JP2006/313051 WO 20060630
- International Announcement: WO2007/013256 WO 20070201
- Main IPC: B22D46/00
- IPC: B22D46/00 ; G01N1/12

Abstract:
A process and a device for easily and rapidly producing a metal sample for analysis for determining the content of impurities in a molten metal with high accuracy. More particularly, according to the metal sample production process, a metal sample for high accuracy analysis is produced by solidifying a collected molten metal without segregating impurities contained in a molten metal, by rapidly cooling a collected molten metal using a metal sample production device having a thin-walled mold having a thin sample collection space for collecting a molten metal, and an opening/closing operation part with which the mold can be freely opened/closed.
Public/Granted literature
- US20100282430A1 DEVICE FOR PRODUCING METAL SAMPLE AND PROCESS FOR PRODUCING METAL SAMPLE Public/Granted day:2010-11-11
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