Invention Grant
- Patent Title: Electrical connector for test socket
- Patent Title (中): 用于测试插座的电气连接器
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Application No.: US12547500Application Date: 2009-08-26
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Publication No.: US07972159B2Publication Date: 2011-07-05
- Inventor: Ming-Yue Chen , Shih-Wei Hsiao , Ke-Hao Chen , Wen-Yi Hsieh
- Applicant: Ming-Yue Chen , Shih-Wei Hsiao , Ke-Hao Chen , Wen-Yi Hsieh
- Applicant Address: TW New Taipei
- Assignee: Hon Hai Precision Ind. Co., Ltd.
- Current Assignee: Hon Hai Precision Ind. Co., Ltd.
- Current Assignee Address: TW New Taipei
- Agent Andrew C. Cheng; Wei Te Chung; Ming Chieh Chang
- Priority: TW097132449 20080826; TW097133393 20080901
- Main IPC: H01R11/22
- IPC: H01R11/22

Abstract:
An electrical connector (100) for electrically connecting a Central Processing Unit (CPU) with a Printed Circuit Board (PCB), includes a base (2), a plurality of insulative layers (34), a plurality of contacts (4) and a plurality of cams (33). The base defines a cavity (21) and the insulative layers are stacked and received in the cavity. The insulative layers define a plurality of passageways therein. The contacts are received in the passageways of the insulative layers. The cams are rotatable around to push different insulative layers to have different degrees of movement in a predetermined direction.
Public/Granted literature
- US20100055936A1 ELECTRICAL CONNECTOR FOR TEST SOCKET Public/Granted day:2010-03-04
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