Invention Grant
- Patent Title: System for testing and sorting electronic components
- Patent Title (中): 电子元件的测试和排序系统
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Application No.: US11753880Application Date: 2007-05-25
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Publication No.: US07973259B2Publication Date: 2011-07-05
- Inventor: Pei Wei Tsai , Chak Tong Sze , Sai Kit Wong , Fong Shing Yip
- Applicant: Pei Wei Tsai , Chak Tong Sze , Sai Kit Wong , Fong Shing Yip
- Applicant Address: HK Hong Kong
- Assignee: ASM Assembly Automation Ltd
- Current Assignee: ASM Assembly Automation Ltd
- Current Assignee Address: HK Hong Kong
- Agency: Ostrolenk Faber LLP
- Main IPC: B07C5/344
- IPC: B07C5/344

Abstract:
A sorting system is provided for electronic components such as LED devices which includes a testing station for testing and determining a characteristic of each electronic component. A first tray has a plurality of receptacles for receiving tested electronic components and a second tray has more receptacles than the first tray for receiving tested electronic components. Electronic components comprising tested characteristics that occur with greater frequency are loaded into the receptacles of the first tray and electronic components comprising tested characteristics that occur with lower frequency are loaded into the receptacles of the second tray.
Public/Granted literature
- US20080290004A1 SYSTEM FOR TESTING AND SORTING ELECTRONIC COMPONENTS Public/Granted day:2008-11-27
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