Invention Grant
US07973383B2 Semiconductor integrated circuit device having a decoupling capacitor
有权
具有去耦电容器的半导体集成电路器件
- Patent Title: Semiconductor integrated circuit device having a decoupling capacitor
- Patent Title (中): 具有去耦电容器的半导体集成电路器件
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Application No.: US11860050Application Date: 2007-09-24
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Publication No.: US07973383B2Publication Date: 2011-07-05
- Inventor: Masayuki Furumiya , Hiroaki Ohkubo , Yasutaka Nakashiba
- Applicant: Masayuki Furumiya , Hiroaki Ohkubo , Yasutaka Nakashiba
- Applicant Address: JP
- Assignee: Renesas Electronics Corporation
- Current Assignee: Renesas Electronics Corporation
- Current Assignee Address: JP
- Agency: Hayes Soloway P.C.
- Priority: JP2002-310187 20021024
- Main IPC: H01L29/00
- IPC: H01L29/00 ; H01L21/8238

Abstract:
The bottom side of an N type silicon substrate is connected to a power supply terminal, a second P type epitaxial layer is formed on all sides of the N type silicon substrate, and a device forming portion is provided on the second P type epitaxial layer. A first P type epitaxial layer and an interlayer insulating film are provided on the device forming portion and an N well and a P well are formed on the top surface of the first P type epitaxial layer. The second P type epitaxial layer is connected to a ground terminal via the first P type epitaxial layer, the P well, a p+ diffusion region, a via and a wire. Accordingly, a pn junction is formed at the interface between the second P type epitaxial layer and the N type silicon substrate.
Public/Granted literature
- US20080265372A1 SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE Public/Granted day:2008-10-30
Information query
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