Invention Grant
- Patent Title: Through-substrate via for semiconductor device
- Patent Title (中): 用于半导体器件的通孔基板通孔
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Application No.: US11844650Application Date: 2007-08-24
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Publication No.: US07973413B2Publication Date: 2011-07-05
- Inventor: Chen-Cheng Kuo , Chen Chen-Shien , Kai-Ming Ching , Chih-Hua Chen
- Applicant: Chen-Cheng Kuo , Chen Chen-Shien , Kai-Ming Ching , Chih-Hua Chen
- Applicant Address: TW Hsin-Chu
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW Hsin-Chu
- Agency: Haynes and Boone, LLP
- Main IPC: H01L23/52
- IPC: H01L23/52

Abstract:
A semiconductor device including a substrate having a front surface and a back surface is provided. A plurality of interconnect layers are formed on the front surface and have a first surface opposite the front surface of the substrate. A tapered profile via extends from the first surface of the plurality of interconnect layers to the back surface of the substrate. In one embodiment, a insulating layer is formed on the substrate and includes an opening, and wherein the opening includes conductive material providing contact to the tapered profile via.
Public/Granted literature
- US20090051039A1 THROUGH-SUBSTRATE VIA FOR SEMICONDUCTOR DEVICE Public/Granted day:2009-02-26
Information query
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