Invention Grant
- Patent Title: Display device and method for inspecting the same
- Patent Title (中): 显示装置及其检查方法
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Application No.: US11615698Application Date: 2006-12-22
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Publication No.: US07973670B2Publication Date: 2011-07-05
- Inventor: Tomoyuki Iwabuchi , Tatsuro Ueno
- Applicant: Tomoyuki Iwabuchi , Tatsuro Ueno
- Applicant Address: JP Atsugi-shi, Kanagawa-ken
- Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee Address: JP Atsugi-shi, Kanagawa-ken
- Agency: Fish & Richardson P.C.
- Priority: JP2005-378290 20051228
- Main IPC: G08B21/00
- IPC: G08B21/00 ; H02H9/00 ; G09G3/32 ; G09G5/00 ; H05B37/00

Abstract:
An object is to provide a display device, in a part of which a monitor light emitting element is provided and in which an anode and a cathode of the monitor light emitting element are prevented from short-circuiting in an early stage and over time by using a circuit which corrects a voltage or a current to be supplied to a light emitting element in consideration of electrical property fluctuation of the monitor light emitting element, and a method for inspecting the display device. A monitor light emitting element is provided, which is electrically connected to a monitor line for supplying a current is provided, and a circuit is provided, which electrically disconnects the monitor light emitting element when an anode and a cathode of the monitor light emitting element are short-circuited in an early stage or over time. Further, a circuit for checking circuit operation before or after a step of providing the monitor light emitting element is provided.
Public/Granted literature
- US20070159742A1 DISPLAY DEVICE AND METHOD FOR INSPECTING THE SAME Public/Granted day:2007-07-12
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