Invention Grant
- Patent Title: Physical quantity measuring apparatus utilizing optical frequency domain reflectometry and method for temperature and strain measurement using the apparatus
- Patent Title (中): 使用光频域反射测量的物理量测量装置和使用该装置的温度和应变测量方法
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Application No.: US12700506Application Date: 2010-02-04
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Publication No.: US07973914B2Publication Date: 2011-07-05
- Inventor: Koji Omichi , Akira Sakamoto , Shunichirou Hirafune
- Applicant: Koji Omichi , Akira Sakamoto , Shunichirou Hirafune
- Applicant Address: JP Tokyo
- Assignee: Fujikura Ltd.
- Current Assignee: Fujikura Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Sughrue Mion, PLLC
- Priority: JP2008-051344 20080229; JP2008-051345 20080229; JP2008-311286 20081205; JP2008-311287 20081205
- Main IPC: G01N21/00
- IPC: G01N21/00 ; G01L1/24 ; G02B6/00

Abstract:
A physical quantity measuring apparatus utilizing optical frequency domain reflectometry includes a tunable laser; a first polarization maintaining fiber; a polarization maintaining coupler; a second polarization maintaining fiber; a third polarization maintaining fiber; a sensor consists of a fiber Bragg grating formed in a core of the third polarization maintaining fiber; a fourth polarization maintaining fiber; a photodiode detects Bragg reflected light from the sensor and reference light from the referential reflecting end; a controller that detects modulation of an interference intensity between the Bragg reflected light and the reference light; and an incidence part that inputs the measuring light, wherein the incidence part being provided on the first polarization maintaining fiber or on both the second polarization maintaining fiber and the third polarization maintaining fiber.
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