Invention Grant
- Patent Title: Reflection characteristic measuring apparatus for sheet specimen and method of calibrating reflection characteristic measuring apparatus for sheet specimen
- Patent Title (中): 用于片材试样的反射特性测量装置和用于片材试样的校准反射特性测量装置的方法
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Application No.: US12290868Application Date: 2008-11-04
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Publication No.: US07973935B2Publication Date: 2011-07-05
- Inventor: Kenji Imura
- Applicant: Kenji Imura
- Applicant Address: JP Osaka
- Assignee: Konica Minolta Sensing, Inc.
- Current Assignee: Konica Minolta Sensing, Inc.
- Current Assignee Address: JP Osaka
- Agency: Brinks Hofer Gilson & Lione
- Priority: JP2007-288644 20071106; JP2007-288645 20071106
- Main IPC: G01N21/84
- IPC: G01N21/84 ; G01N21/55 ; G01N21/00

Abstract:
A reflection characteristic measuring apparatus capable of scanning a specimen surface of a sheet specimen at a high speed is provided. The reflection characteristic measuring apparatus includes a group of illuminating and light-receiving systems for directing illuminating light onto the specimen surface of the sheet specimen held by a specimen holding roller pair and for receiving reflected light from the specimen surface. The illuminating and light-receiving systems measure a spectral characteristic of the received reflected light. The illuminating and light-receiving systems are disposed over one-dimensional arrays of color samples which extend in the longitudinal direction of the sheet specimen, and scan the one-dimensional arrays in a direction opposite to a direction in which the sheet specimen is transported.
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