Invention Grant
- Patent Title: X-ray detection methods and apparatus
- Patent Title (中): X射线检测方法和装置
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Application No.: US11523359Application Date: 2006-09-19
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Publication No.: US07974377B2Publication Date: 2011-07-05
- Inventor: David Michael Hoffman , Jeffrey Alan Kautzer
- Applicant: David Michael Hoffman , Jeffrey Alan Kautzer
- Applicant Address: US NY Schenectady
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Schenectady
- Agency: Ziolkowski Patent Solutions Group, SC
- Main IPC: A61B6/00
- IPC: A61B6/00
Abstract:
A method includes inserting a first x-ray detector between a second x-ray detector and an object.
Public/Granted literature
- US20080069298A1 X-ray detection methods and apparatus Public/Granted day:2008-03-20
Information query
