Invention Grant
- Patent Title: System and method for detecting defects in camera modules
- Patent Title (中): 用于检测相机模块中的缺陷的系统和方法
-
Application No.: US11875123Application Date: 2007-10-19
-
Publication No.: US07974458B2Publication Date: 2011-07-05
- Inventor: Chih-Wei Huang
- Applicant: Chih-Wei Huang
- Applicant Address: TW Tu-Cheng, New Taipei
- Assignee: Hon Hai Precision Industry Co., Ltd.
- Current Assignee: Hon Hai Precision Industry Co., Ltd.
- Current Assignee Address: TW Tu-Cheng, New Taipei
- Agent Jeffrey T. Knapp
- Priority: CN200710200386 20070404
- Main IPC: G06K9/00
- IPC: G06K9/00 ; H04N9/64

Abstract:
A method for detecting defects in camera modules is provided. The method includes the following: an image is acquired from the camera module; a comparison formula and a standard value of defect luminance are set; the image is divided into many test regions; the corresponding reference regions are then plotted out; a test region is selected, and a reference region is confirmed correspondingly; averages of gray scale values of the selected test region and the confirmed reference region are calculated; a defect luminance of the selected test region is calculated; the calculated defect luminance is compared with the standard value for confirming whether the camera module is of satisfactory quality. A related system is also disclosed.
Public/Granted literature
- US20080247634A1 SYSTEM AND METHOD FOR DETECTING DEFECTS IN CAMERA MODULES Public/Granted day:2008-10-09
Information query