Invention Grant
- Patent Title: Lead integrity testing during suspected tachyarrhythmias
- Patent Title (中): 疑似快速性心律失常时引导完整性检测
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Application No.: US12164583Application Date: 2008-06-30
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Publication No.: US07974690B2Publication Date: 2011-07-05
- Inventor: Stefan G. Kracker
- Applicant: Stefan G. Kracker
- Applicant Address: US MN Minneapolis
- Assignee: Medtronic, Inc.
- Current Assignee: Medtronic, Inc.
- Current Assignee Address: US MN Minneapolis
- Agent Michael J. Ostrom; Stephen W. Bauer
- Main IPC: A61N1/362
- IPC: A61N1/362

Abstract:
Techniques for performing a lead integrity test during a suspected tachyarrhythmia are described. An implantable medical device (IMD) may perform the test prior to delivering a therapeutic shock to treat the suspected tachyarrhythmia and, in some cases, may withhold the shock based on the test. In some examples, the IMD measures an impedance of a lead a plurality of times during the suspected tachyarrhythmia. In some examples, the IMD measures the impedance a plurality of times between two sensed events of the suspected tachyarrhythmia. The IMD or another device may determine a variability of, or otherwise compare, the measured impedances to evaluate the integrity of the lead. Instead of or in addition to withholding a shock, the IMD or another device may change a sensing or stimulation vector of the IMD, or provide an alert to a user, if the integrity test indicates a possible lead integrity issue.
Public/Granted literature
- US20090326600A1 LEAD INTEGRITY TESTING DURING SUSPECTED TACHYARRHYTHMIAS Public/Granted day:2009-12-31
Information query
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