Invention Grant
- Patent Title: Method and system to check an electronic metrological measurement instrument
- Patent Title (中): 检查电子计量测量仪器的方法和系统
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Application No.: US10534679Application Date: 2003-11-13
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Publication No.: US07974734B2Publication Date: 2011-07-05
- Inventor: Raffaele Pera , Mirko Spagnolatti , Giorgio Della Fonte
- Applicant: Raffaele Pera , Mirko Spagnolatti , Giorgio Della Fonte
- Applicant Address: US TX Addison
- Assignee: Dresser, Inc.
- Current Assignee: Dresser, Inc.
- Current Assignee Address: US TX Addison
- Agency: Fish & Richardson P.C.
- Priority: ITMI2002A2419 20021115
- International Application: PCT/EP03/12826 WO 20031113
- International Announcement: WO2004/046016 WO 20040603
- Main IPC: G06F17/00
- IPC: G06F17/00
Abstract:
Control system of an electronic instrument for metrological measurements, comprising an electronic local processing unit including a handling application of said instrument. The system includes a control application for said handling application, which can be associated with said local processing unit, said control application being suitable for generating a univocal certification code for the application.
Public/Granted literature
- US20060266245A1 Method and system to controlling an electronic instrument for metrological measurement Public/Granted day:2006-11-30
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