Invention Grant
- Patent Title: Methods and systems for intensity modeling including polarization
- Patent Title (中): 包括极化的强度建模方法和系统
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Application No.: US12120052Application Date: 2008-05-13
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Publication No.: US07974819B2Publication Date: 2011-07-05
- Inventor: Chung-Yi Lee , Fei Wang
- Applicant: Chung-Yi Lee , Fei Wang
- Applicant Address: KY George Town, Grand Cayman
- Assignee: Aptina Imaging Corporation
- Current Assignee: Aptina Imaging Corporation
- Current Assignee Address: KY George Town, Grand Cayman
- Agency: Kramer Levin Naftalis & Frankel LLP
- Main IPC: G06F17/10
- IPC: G06F17/10 ; G06F17/11 ; G06F17/16 ; G06F7/60 ; G06F17/50

Abstract:
Embodiments of the present invention provide computer readable media encoded with executable instructions for modeling an intensity profile at a surface illuminated by an illumination source through a mask. Further embodiments provide methods for correcting a mask pattern and methods for selecting an illumination source. Still further embodiments provide masks and integrated circuits produced using a model of the illumination source. Embodiments of the present invention take into account the polarization of the illumination source and are able to model the effect of polarization on the resultant intensity profile.
Public/Granted literature
- US20090287461A1 METHODS AND SYSTEMS FOR INTENSITY MODELING INCLUDING POLARIZATION Public/Granted day:2009-11-19
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