Invention Grant
US07975082B2 System and method to facilitate deterministic testing of data transfers between independent clock domains on a chip
有权
系统和方法,以促进芯片上独立时钟域之间的数据传输的确定性测试
- Patent Title: System and method to facilitate deterministic testing of data transfers between independent clock domains on a chip
- Patent Title (中): 系统和方法,以促进芯片上独立时钟域之间的数据传输的确定性测试
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Application No.: US12478696Application Date: 2009-06-04
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Publication No.: US07975082B2Publication Date: 2011-07-05
- Inventor: Frank C. Chiu , Ian Jones , Anup Pradhan , Iain Robertson
- Applicant: Frank C. Chiu , Ian Jones , Anup Pradhan , Iain Robertson
- Applicant Address: US CA Redwood City
- Assignee: Oracle America, Inc.
- Current Assignee: Oracle America, Inc.
- Current Assignee Address: US CA Redwood City
- Agency: Martine Penilla & Gencarella, LLP
- Main IPC: G06F3/00
- IPC: G06F3/00 ; G06F5/00

Abstract:
A system and method of deterministically transferring data across a first clock domain to a second clock domain includes receiving a resynchronize command, initiating a corresponding one of a plurality of read delays in each one of a second plurality of devices in the second clock domain, counting down the plurality of read delays to zero, receiving a training pattern after the plurality of read delays count down to zero in each one of the second plurality of devices, recovering a clock data in each of the second plurality of devices, receiving a synch byte by each of the second plurality of devices, selecting one of a plurality of serial lanes as a reference lane, wherein the plurality of serial lanes couple the first clock domain to the second clock domain, initiating a write pointer, writing n bytes of serial data to a buffer and converting the n bytes of data from serial data to parallel data in a serial to parallel converter such that the serial n byte data in the buffer are aligned in time.
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