Invention Grant
US07975082B2 System and method to facilitate deterministic testing of data transfers between independent clock domains on a chip 有权
系统和方法,以促进芯片上独立时钟域之间的数据传输的确定性测试

System and method to facilitate deterministic testing of data transfers between independent clock domains on a chip
Abstract:
A system and method of deterministically transferring data across a first clock domain to a second clock domain includes receiving a resynchronize command, initiating a corresponding one of a plurality of read delays in each one of a second plurality of devices in the second clock domain, counting down the plurality of read delays to zero, receiving a training pattern after the plurality of read delays count down to zero in each one of the second plurality of devices, recovering a clock data in each of the second plurality of devices, receiving a synch byte by each of the second plurality of devices, selecting one of a plurality of serial lanes as a reference lane, wherein the plurality of serial lanes couple the first clock domain to the second clock domain, initiating a write pointer, writing n bytes of serial data to a buffer and converting the n bytes of data from serial data to parallel data in a serial to parallel converter such that the serial n byte data in the buffer are aligned in time.
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