Invention Grant
- Patent Title: On-chip scan clock generator for ASIC testing
- Patent Title (中): 用于ASIC测试的片上扫描时钟发生器
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Application No.: US10404306Application Date: 2003-03-31
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Publication No.: US07975197B2Publication Date: 2011-07-05
- Inventor: Iain Clark , Juergen Dirks
- Applicant: Iain Clark , Juergen Dirks
- Applicant Address: US CA Milpitas
- Assignee: LSI Corporation
- Current Assignee: LSI Corporation
- Current Assignee Address: US CA Milpitas
- Agency: Luedeka, Neely & Graham, P.C.
- Main IPC: G01R31/28
- IPC: G01R31/28

Abstract:
A scan clock generator includes a clock signal input for receiving a clock signal, a scan shift mode signal input for receiving a scan shift mode signal, and a sequence controller coupled to the clock signal input for gating a selected number of clock signal pulses at a time to generate a sequence of nonconcurrent scan clock signals at separate outputs respectively in response to a first state of the scan shift mode signal.
Public/Granted literature
- US20040193981A1 On-chip scan clock generator for asic testing Public/Granted day:2004-09-30
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