Invention Grant
- Patent Title: Test system and back annotation method
- Patent Title (中): 测试系统和背面注释方法
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Application No.: US12407202Application Date: 2009-03-19
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Publication No.: US07975198B2Publication Date: 2011-07-05
- Inventor: Masaru Yokoyama
- Applicant: Masaru Yokoyama
- Applicant Address: JP Tokyo
- Assignee: Advantest Corporation
- Current Assignee: Advantest Corporation
- Current Assignee Address: JP Tokyo
- Agency: Osha • Liang LLP
- Priority: JP2008-072401 20080319
- Main IPC: G01R31/28
- IPC: G01R31/28

Abstract:
A test system for performing a test of a device is provided that comprises a source file of a test plan that describes a program for performing a test, and one or more of elements that are formed in a unit that divides the source file into one or more blocks. The test system further comprises an annotatable object that, when debugging of objects of the source file is performed, manages modification details of the debugging with reference to an element corresponding to a portion where the debugging is performed, and a controller that, after the debugging, rewrites the source file with details after the debugging is performed on an element basis based on the element and the annotatable object.
Public/Granted literature
- US20090240989A1 TEST SYSTEM AND BACK ANNOTATION METHOD Public/Granted day:2009-09-24
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