Invention Grant
- Patent Title: Operation timing verifying apparatus and program
- Patent Title (中): 操作定时验证装置和程序
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Application No.: US12261123Application Date: 2008-10-30
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Publication No.: US07975249B2Publication Date: 2011-07-05
- Inventor: Shigekiyo Akutsu
- Applicant: Shigekiyo Akutsu
- Applicant Address: JP
- Assignee: Oki Semiconductor Co., Ltd.
- Current Assignee: Oki Semiconductor Co., Ltd.
- Current Assignee Address: JP
- Agency: Studebaker & Brackett PC
- Agent Donald R. Studebaker
- Priority: JP2007-292932 20071112
- Main IPC: G06F17/50
- IPC: G06F17/50

Abstract:
An operation timing verifying apparatus and program for accurately verifying operation timings of a semiconductor integrated circuit in design with suppressing design time and cost. The operation timing verifying apparatus and program sets an unreal corner condition that all delay elements present a maximum delay as an operating condition, performs operation timing analysis in the operating condition, thereby extracting an operation-violating circuit path, if any, from a circuit layout, sets a real corner condition that at least one element type of delay elements from among the delay elements present a maximum delay as the operating condition and performs the operation timing analysis on only the operation-violating circuit path to determine again whether an operation violation exists therein.
Public/Granted literature
- US20090276744A1 OPERATION TIMING VERIFYING APPARATUS AND PROGRAM Public/Granted day:2009-11-05
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