Invention Grant
- Patent Title: Method of manufacturing silicon nanowires using silicon nanodot thin film
- Patent Title (中): 使用硅纳米点薄膜制造硅纳米线的方法
-
Application No.: US12304737Application Date: 2006-12-08
-
Publication No.: US07985666B2Publication Date: 2011-07-26
- Inventor: Rae-Man Park , Sang-Hyeob Kim , Jonghyurk Park , Sunglyul Maeng
- Applicant: Rae-Man Park , Sang-Hyeob Kim , Jonghyurk Park , Sunglyul Maeng
- Applicant Address: KR Daejeon
- Assignee: Electronics and Telecommunications Research Institute
- Current Assignee: Electronics and Telecommunications Research Institute
- Current Assignee Address: KR Daejeon
- Agency: Rabin & Berdo, PC
- Priority: KR10-2006-0053896 20060615
- International Application: PCT/KR2006/005309 WO 20061208
- International Announcement: WO2007/145407 WO 20071221
- Main IPC: H01L21/20
- IPC: H01L21/20 ; H01L21/36

Abstract:
Provided is a method of manufacturing silicon nanowires including: forming a silicon nanodot thin film having a plurality of silicon nanodots exposed on a substrate; and growing the silicon nanowires on the silicon nanodot thin film using the silicon nanodots as a nucleation site. The silicon nanowires can be manufactured using the silicon nanodot thin film disposed in a silicon nitride matrix, as a nucleation site instead of using catalytic metal islands, wherein the silicon nanodot thin film includes the silicon nanodots.
Public/Granted literature
- US20090325365A1 METHOD OF MANUFACTURING SILICON NANOWIRES USING SILICON NANODOT THIN FILM Public/Granted day:2009-12-31
Information query
IPC分类: