Invention Grant
- Patent Title: Etching method, semiconductor and fabricating method for the same
- Patent Title (中): 蚀刻方法,半导体及其制造方法相同
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Application No.: US12766243Application Date: 2010-04-23
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Publication No.: US07985691B2Publication Date: 2011-07-26
- Inventor: Kenshi Kanegae , Shinichi Imai , Hideo Nakagawa
- Applicant: Kenshi Kanegae , Shinichi Imai , Hideo Nakagawa
- Applicant Address: JP Kadoma-shi, Osaka
- Assignee: Panasonic Corporation
- Current Assignee: Panasonic Corporation
- Current Assignee Address: JP Kadoma-shi, Osaka
- Agency: Nixon Peabody LLP
- Agent Jeffrey L. Costellia
- Priority: JP2000-117680 20000419
- Main IPC: H01L21/302
- IPC: H01L21/302

Abstract:
An organic/inorganic hybrid film represented by SiCxHyOz (x>0, y≧0, z>0) is plasma-etched with an etching gas containing fluorine, carbon and nitrogen. During the etching, a carbon component is eliminated from the surface portion of the organic/inorganic hybrid film due to the existence of the nitrogen in the etching gas, to thereby reform the surface portion. The reformed surface portion is nicely plasma-etched with the etching gas containing fluorine and carbon.
Public/Granted literature
- US20100203733A1 ETCHING METHOD, SEMICONDUCTOR AND FABRICATING METHOD FOR THE SAME Public/Granted day:2010-08-12
Information query
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