Invention Grant
- Patent Title: X-ray detection panel and X-ray detector
- Patent Title (中): X射线检测面板和X射线检测器
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Application No.: US12536989Application Date: 2009-08-06
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Publication No.: US07985954B2Publication Date: 2011-07-26
- Inventor: Kwan-Wook Jung , Dae-Ho Choo
- Applicant: Kwan-Wook Jung , Dae-Ho Choo
- Applicant Address: KR Suwon-Si, Gyeonggi-Do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-Si, Gyeonggi-Do
- Agency: F. Chau & Associates, LLC
- Priority: KR10-2008-0085246 20080829
- Main IPC: G01T1/24
- IPC: G01T1/24
Abstract:
An X-ray detector includes a plurality of bias connection lines that connect both ends, respectively, of a bias line for applying a bias voltage to a PIN diode. The bias line includes first and second bias lines.
Public/Granted literature
- US20100051819A1 X-Ray Detection Panel and X-Ray Detector Public/Granted day:2010-03-04
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