Invention Grant
- Patent Title: Memory using variable tunnel barrier widths
- Patent Title (中): 使用可变隧道势垒宽度的内存
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Application No.: US12454698Application Date: 2009-05-21
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Publication No.: US07985963B2Publication Date: 2011-07-26
- Inventor: Darrell Rinerson , Christophe Chevallier , Wayne Kinney , Edmond Ward
- Applicant: Darrell Rinerson , Christophe Chevallier , Wayne Kinney , Edmond Ward
- Assignee: Unity Semiconductor Corporation
- Current Assignee: Unity Semiconductor Corporation
- Main IPC: H01L47/00
- IPC: H01L47/00

Abstract:
A memory using a tunnel barrier that has a variable effective width is disclosed. A memory element includes a tunneling barrier and a conductive material. The conductive material typically has mobile ions that either move towards or away from the tunneling barrier in response to a voltage across the memory element. A low conductivity region is either formed or destroyed. It can be formed by either the depletion or excess ions around the tunneling barrier, or by the mobile ions combining with complementary ions. It may be destroyed by either reversing the forming process or by reducing the tunneling barrier and injecting ions into the conductive material. The low conductivity region increases the effective width of the tunnel barrier, making electrons tunnel a greater distance, which reduces the memory element's conductivity. By varying conductivity multiple states can be created in the memory cell.
Public/Granted literature
- US20090231906A1 Memory using variable tunnel barrier widths Public/Granted day:2009-09-17
Information query
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