Invention Grant
- Patent Title: Method for determining the centrality of masks
- Patent Title (中): 确定面具中心性的方法
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Application No.: US12286026Application Date: 2008-09-26
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Publication No.: US07986409B2Publication Date: 2011-07-26
- Inventor: Michael Heiden
- Applicant: Michael Heiden
- Applicant Address: DE Weilburg
- Assignee: Vistec Semiconductor Systems GmbH
- Current Assignee: Vistec Semiconductor Systems GmbH
- Current Assignee Address: DE Weilburg
- Agency: Davidson Davidson & Kappel, LLC
- Priority: DE102007049100 20071011
- Main IPC: G01B11/00
- IPC: G01B11/00 ; G01B11/14 ; G06K9/00

Abstract:
A method for determining the centrality of masks is disclosed. The mask is positioned in a coordinate measuring device on a measurement table displaceable in a direction perpendicular to the optical axis of an imaging measurement system in an interferometrically measurable way. The position of a mask coordinate system with respect to the measuring device coordinate system is determined based on at lest two structures on the mask. The relative distance from one of the at least first and second outer edges to the at least two structures is determined. The coordinate measuring machine determines the actual coordinates of the at least two structures with respect to the respective outer edges, which must not exceed a predetermined deviation from a desired value.
Public/Granted literature
- US20090097041A1 Method for determining the centrality of masks Public/Granted day:2009-04-16
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