Invention Grant
- Patent Title: Apparatus and method for optical 3D measurement
- Patent Title (中): 用于光学3D测量的装置和方法
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Application No.: US12506531Application Date: 2009-07-21
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Publication No.: US07986415B2Publication Date: 2011-07-26
- Inventor: Frank Thiel , Joachim Pfeiffer , Peter Fornoff
- Applicant: Frank Thiel , Joachim Pfeiffer , Peter Fornoff
- Applicant Address: DE Bensheim
- Assignee: Sirona Dental Systems GmbH
- Current Assignee: Sirona Dental Systems GmbH
- Current Assignee Address: DE Bensheim
- Agency: Fitzpatrick, Cella, Harper & Scinto
- Priority: DE102007005726 20070131
- Main IPC: G01B11/24
- IPC: G01B11/24
Abstract:
The invention relates to an apparatus and a method for optical 3D measurement, comprising a first beam deflector for deflecting an illuminating beam onto a measurement object and for deflecting the observation beam which is radiated back by the measurement object, wherein the first beam deflector can move along a path distance S.
Public/Granted literature
- US20090279103A1 APPARATUS AND METHOD FOR OPTICAL 3D MEASUREMENT Public/Granted day:2009-11-12
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