Invention Grant
US07986497B2 Low resistance TMR read head fabricated by a novel oxidation method
有权
通过新型氧化法制造的低电阻TMR读头
- Patent Title: Low resistance TMR read head fabricated by a novel oxidation method
- Patent Title (中): 通过新型氧化法制造的低电阻TMR读头
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Application No.: US11899047Application Date: 2007-09-04
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Publication No.: US07986497B2Publication Date: 2011-07-26
- Inventor: Cheng T. Horng , Ru-Ying Tong
- Applicant: Cheng T. Horng , Ru-Ying Tong
- Applicant Address: US CA Milpitas
- Assignee: Headway Technologies, Inc.
- Current Assignee: Headway Technologies, Inc.
- Current Assignee Address: US CA Milpitas
- Agency: Saile Ackerman LLC
- Agent Stephen B. Ackerman
- Main IPC: G11B5/33
- IPC: G11B5/33

Abstract:
The invention is a magnetoresistive read head with an MTJ configuration having an ultra-thin tunneling barrier layer with low resistance and high breakdown strength. The barrier layer is formed by natural oxidation of an ultra-thin (two atomic layers) Al or Hf—Al layer deposited on an electrode whose surface has first been treated to form an oxygen surfactant layer. The oxygen within the surfactant layer is first adsorbed within the ultra-thin layer and the layer is subsequently naturally oxidized to produce a uniform and stable Al2O3 stoichiometry (or HfO stoichiometry) in the tunneling barrier layer.
Public/Granted literature
- US20070298284A1 Low resistance TMR read head fabricated by a novel oxidation method Public/Granted day:2007-12-27
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