Invention Grant
- Patent Title: Ultra high resolution timing measurement
- Patent Title (中): 超高分辨率时序测量
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Application No.: US12757396Application Date: 2010-04-09
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Publication No.: US07986591B2Publication Date: 2011-07-26
- Inventor: Nan-Hsin Tseng , Chin-Chou Liu , Saurabh Gupta
- Applicant: Nan-Hsin Tseng , Chin-Chou Liu , Saurabh Gupta
- Applicant Address: TW
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW
- Agency: Lowe Hauptman Ham & Berner, LLP
- Main IPC: G04F8/00
- IPC: G04F8/00 ; G01R13/02

Abstract:
An integrated circuit for high-resolution timing measurement includes a delay pulse generator, the first oscillator to generate the first clock with the first frequency, the second oscillator to generate the second clock with the second frequency, an oscillator tuner, a sampling module, a counter, wherein the delay pulse generator generated a delayed pulse from the second clock, the oscillator tuner controls the second frequency to be as close as possible to the first frequency without being the same as the second frequency, the sampling module samples the delayed pulse at the first frequency, the counter generates a digital counter value by counting a number of sampling by the sampling module, and a time width of the delayed pulse can be calculated by the digital counter value. The second oscillator can be a tunable ring oscillator with one or more coarse tune stages and one or more fine-tune stages.
Public/Granted literature
- US20110038451A1 ULTRA HIGH RESOLUTION TIMING MEASUREMENT Public/Granted day:2011-02-17
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