Invention Grant
- Patent Title: Non-linear frequency and phase measurement scheme
- Patent Title (中): 非线性频率和相位测量方案
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Application No.: US11577088Application Date: 2005-09-26
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Publication No.: US07987061B2Publication Date: 2011-07-26
- Inventor: Alexander Lampe
- Applicant: Alexander Lampe
- Applicant Address: CH Plan-les-Ouates
- Assignee: ST-Ericsson SA
- Current Assignee: ST-Ericsson SA
- Current Assignee Address: CH Plan-les-Ouates
- Agency: Seed IP Law Group PLLC
- Agent Robert Iannucci
- Priority: EP04104975 20041011
- International Application: PCT/IB2005/053177 WO 20050926
- International Announcement: WO2006/040699 WO 20060420
- Main IPC: G01R25/08
- IPC: G01R25/08

Abstract:
The present invention relates to a method and apparatus for measuring a frequency or a phase of a measuring signal, wherein the frequency (fg) or the phase (φg) are estimated by approximating the relationship between a collecting clock (c) and a gating clock (g) based on a non-linear step-shaped function. Thereby, the estimation error can be improved with almost negligible complexity increase in signal processing.
Public/Granted literature
- US20090030629A1 NON-LINEAR FREQUENCY AND PHASE MEASUREMENT SCHEME Public/Granted day:2009-01-29
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