Invention Grant
- Patent Title: Tweezer-equipped scanning probe microscope and transfer method
- Patent Title (中): 镊子扫描探针显微镜和转印方法
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Application No.: US12130311Application Date: 2008-05-30
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Publication No.: US07987703B2Publication Date: 2011-08-02
- Inventor: Takashi Konno , Masatoshi Yasutake
- Applicant: Takashi Konno , Masatoshi Yasutake
- Applicant Address: JP Takamatsu-shi JP Chiba-shi
- Assignee: AOI Electronics Co., Ltd.,SII Nano Technology Inc.
- Current Assignee: AOI Electronics Co., Ltd.,SII Nano Technology Inc.
- Current Assignee Address: JP Takamatsu-shi JP Chiba-shi
- Agency: Crowell & Moring LLP
- Priority: JP2007-147183 20070601
- Main IPC: G01B5/28
- IPC: G01B5/28

Abstract:
A tweezer-equipped scanning probe microscope comprises a first arm with a probing portion, a second arm that moves along an opening direction or a closing direction relative to the first arm, an electrostatic actuator that drives the second arm along the opening direction or the closing direction based upon an opening/closing drive voltage applied thereto, an amplifier that induces self-oscillation in the electrostatic actuator by using an electrically equivalent circuit accompanying the electrostatic actuator as a feedback circuit and causes the second arm to vibrate through the self-oscillation, and a vibration state detection unit that detects a change of vibration state of the second arm as the second arm contacts an object.
Public/Granted literature
- US20080295585A1 Tweezer-Equipped Scanning Probe Microscope and Transfer Method Public/Granted day:2008-12-04
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