Invention Grant
- Patent Title: Method of estimating alignment
- Patent Title (中): 估计对齐方法
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Application No.: US11491189Application Date: 2006-07-24
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Publication No.: US07988252B2Publication Date: 2011-08-02
- Inventor: Valery Risson , Roma Segura Fabregas , Alejandro Manuel De Pena
- Applicant: Valery Risson , Roma Segura Fabregas , Alejandro Manuel De Pena
- Applicant Address: US TX Houston
- Assignee: Hewlett-Packard Development Company, L.P.
- Current Assignee: Hewlett-Packard Development Company, L.P.
- Current Assignee Address: US TX Houston
- Priority: GB0515543.7 20050729
- Main IPC: B41J29/393
- IPC: B41J29/393

Abstract:
The invention relates to a method of estimating the alignment in the printing medium direction between a first and a second pen of a printing system having a scan axis, whereby: the first, respectively second pen prints a first, respectively second pattern element; the first and second pattern elements are substantially aligned and separated by a space along the scan axis; each of the first and second pattern elements comprises a first and an associated second mark separated by a blank along the scan axis, the first and the second marks being staggered in the printing medium direction; an optical sensor scans along the scan axis over the first and second pattern elements, an analysis of the sensor output leading to estimating the alignment.
Public/Granted literature
- US20080170097A1 Method of estimating alignment Public/Granted day:2008-07-17
Information query
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