Invention Grant
US07988290B2 Systems and methods for measuring the shape and location of an object
有权
用于测量物体的形状和位置的系统和方法
- Patent Title: Systems and methods for measuring the shape and location of an object
- Patent Title (中): 用于测量物体的形状和位置的系统和方法
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Application No.: US12347909Application Date: 2008-12-31
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Publication No.: US07988290B2Publication Date: 2011-08-02
- Inventor: Charles E. Campbell , Stephen W. Farrer , Daniel R. Neal , William S. Powers , Thomas D. Raymond , James Copland
- Applicant: Charles E. Campbell , Stephen W. Farrer , Daniel R. Neal , William S. Powers , Thomas D. Raymond , James Copland
- Applicant Address: US CA Santa Ana
- Assignee: AMO Wavefront Sciences LLC.
- Current Assignee: AMO Wavefront Sciences LLC.
- Current Assignee Address: US CA Santa Ana
- Main IPC: A61B3/10
- IPC: A61B3/10

Abstract:
A system for determining the shape of an object and/or a distance of the object from the system includes a first plurality of light source, a second plurality of light sources, and a detector or detector array. The first plurality of light sources are disposed about a central axis and are separated from the central axis by radial distances defining an aperture in the first plurality of light sources. The system also includes an optical system adapted to provide light from the second plurality of light sources through the aperture to the object. The system may further include a computer configured to determine the shape of the object and/or the distance of the object from the system using light from the first and second plurality of light sources that is reflected from the object and received by the detector.
Public/Granted literature
- US20090161090A1 Systems and Methods for Measuring the Shape and Location of an object Public/Granted day:2009-06-25
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