Invention Grant
- Patent Title: Tactile surface inspection during device fabrication or assembly
- Patent Title (中): 器件制造或装配期间的触觉表面检查
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Application No.: US11852493Application Date: 2007-09-10
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Publication No.: US07989229B2Publication Date: 2011-08-02
- Inventor: James H. Covell
- Applicant: James H. Covell
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Cantor Colburn LLP
- Agent Yuanmin Cai
- Main IPC: G01R31/26
- IPC: G01R31/26

Abstract:
Processes for inspecting a surface during device fabrication include contacting the surface with a tactile sensor. The tactile sensor is an electroluminescent tactile sensor array or a current electrode sensor array or a capacitive sensor array. The sensor is configured to convert local stress resulting from contact with the surface into light intensity and/or modulation in local current density. Both the light intensity and current density are linearly proportional to the local stress. The image stress provided by the sensor can then be captured by focusing the light intensity onto a suitable detector to provide a topographical image of the surface. Current density can alternatively be directly sensed via high resolution electrode array.
Public/Granted literature
- US20090068770A1 TACTILE SURFACE INSPECTION DURING DEVICE FABRICATION OR ASSEMBLY Public/Granted day:2009-03-12
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