Invention Grant
- Patent Title: Method for transferring semiconductor element, method for manufacturing semiconductor device, and semiconductor device
- Patent Title (中): 半导体元件的转印方法,半导体装置的制造方法以及半导体装置
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Application No.: US12162568Application Date: 2006-12-13
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Publication No.: US07989304B2Publication Date: 2011-08-02
- Inventor: Michiko Takei , Kazuhide Tomiyasu , Yasumori Fukushima , Yutaka Takafuji
- Applicant: Michiko Takei , Kazuhide Tomiyasu , Yasumori Fukushima , Yutaka Takafuji
- Applicant Address: JP Osaka
- Assignee: Sharp Kabushiki Kaisha
- Current Assignee: Sharp Kabushiki Kaisha
- Current Assignee Address: JP Osaka
- Agency: Nixon & Vanderhye, P.C.
- Priority: JP2006-089402 20060328
- International Application: PCT/JP2006/324845 WO 20061213
- International Announcement: WO2007/111008 WO 20071004
- Main IPC: H01L21/76
- IPC: H01L21/76 ; H01L21/30 ; H01L21/31

Abstract:
A transistor formed on a monocrystalline Si wafer is temporarily transferred onto a first temporary supporting substrate. The first temporarily supporting substrate is heat-treated at high heat so as to repair crystal defects generated in a transistor channel of the monocrystalline Si wafer when transferring the transistor. The transistor is then made into a chip and transferred onto a TFT substrate. In order to transfer the transistor which has been once separated from the monocrystalline Si wafer, a different method from a stripping method utilizing ion doping is employed.
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