Invention Grant
- Patent Title: Ion trap mass spectrometry method
- Patent Title (中): 离子阱质谱法
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Application No.: US11889232Application Date: 2007-08-10
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Publication No.: US07989764B2Publication Date: 2011-08-02
- Inventor: Hiroyuki Yasuda , Shinji Nagai , Tetsuya Nishida
- Applicant: Hiroyuki Yasuda , Shinji Nagai , Tetsuya Nishida
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: McDermott Will & Emery LLP
- Priority: JP2006-239070 20060904
- Main IPC: H01J49/42
- IPC: H01J49/42 ; H01J49/40

Abstract:
According to an aspect of the present invention, there are provided an ion trap mass spectrometry method and an ion trap mass spectrometry device using a mass spectrometer, the mass spectrometer including: an ion source part for ionizing a sample; an ion trap part for trapping ions generated in the ion source; a main high frequency power source for applying a main high frequency voltage to the ion trap part, and an auxiliary high frequency power source for applying an auxiliary high frequency voltage thereto; and a detector for detecting the ions ejected from the ion trap. The ion trap mass spectrometry method and the ion trap mass spectrometry device includes the steps of: accumulating desired ions into the ion trap part by ejecting undesired ions while accumulating ions into the ion trap part; and ejecting undesired ions that remain in the ion trap part and leaving the desired ions in the ion trap part are repeated alternately.
Public/Granted literature
- US20080054173A1 Ion trap mass spectrometry method Public/Granted day:2008-03-06
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