Invention Grant
- Patent Title: Nonvolatile memory and manufacturing method thereof
- Patent Title (中): 非挥发性记忆及其制造方法
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Application No.: US12047054Application Date: 2008-03-12
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Publication No.: US07989873B2Publication Date: 2011-08-02
- Inventor: Shunpei Yamazaki , Jun Koyama , Keisuke Hayashi
- Applicant: Shunpei Yamazaki , Jun Koyama , Keisuke Hayashi
- Applicant Address: JP Kanagawa-ken
- Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee Address: JP Kanagawa-ken
- Agency: Nixon Peabody LLP
- Agent Jeffrey L. Costellia
- Priority: JP9-273454 19970920; JP10-158315 19980522
- Main IPC: H01L29/788
- IPC: H01L29/788

Abstract:
Memory elements, switching elements, and peripheral circuits to constitute a nonvolatile memory are integrally formed on a substrate by using TFTs. Since semiconductor active layers of memory element TFTs are thinner than those of other TFTs, impact ionization easily occurs in channel regions of the memory element TFTs. This enables low-voltage write/erase operations to be performed on the memory elements, and hence the memory elements are less prone to deteriorate. Therefore, a nonvolatile memory capable of miniaturization can be provided.
Public/Granted literature
- US20090090954A1 NONVOLATILE MEMORY AND MANUFACTURING METHOD THEREOF Public/Granted day:2009-04-09
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