Invention Grant
- Patent Title: Apparatus and method for detecting position of magnetic element
- Patent Title (中): 用于检测磁性元件位置的装置和方法
-
Application No.: US12407120Application Date: 2009-03-19
-
Publication No.: US07990135B2Publication Date: 2011-08-02
- Inventor: Hsiang-Chieh Yu
- Applicant: Hsiang-Chieh Yu
- Applicant Address: TW Tu-Cheng, New Taipei
- Assignee: Hon Hai Precision Industry Co., Ltd.
- Current Assignee: Hon Hai Precision Industry Co., Ltd.
- Current Assignee Address: TW Tu-Cheng, New Taipei
- Agent Clifford O. Chi
- Priority: CN200810302105 20080611
- Main IPC: G01B7/14
- IPC: G01B7/14 ; G01R33/06 ; H01L43/08

Abstract:
An exemplary apparatus for detecting whether a magnetic element is mounted at a correct position on a retaining member is provided. The apparatus includes a holder, a magnetoresistive sensor, and a processor. The magnetoresistive sensor is held by the holder and capable of sensing a present magnetic flux from the magnetic element to the magnetoresistive sensor. The processor is electrically connected to the magnetoresistive sensor and has a predetermined reference magnetic flux stored information therein, configured for obtaining the present magnetic flux and comparing the present magnetic flux with the reference magnetic flux information, thereby detecting whether a magnetic element is mounted at a correct position on a retaining member.
Public/Granted literature
- US20090309582A1 APPARATUS AND METHOD FOR DETECTING POSITION OF MAGNETIC ELEMENT Public/Granted day:2009-12-17
Information query