Invention Grant
- Patent Title: Measurement arrangement for determining the characteristic line parameters by measuring scattering parameters
- Patent Title (中): 通过测量散射参数确定特征线参数的测量装置
-
Application No.: US12050997Application Date: 2008-03-19
-
Publication No.: US07990158B2Publication Date: 2011-08-02
- Inventor: Thomas Ludwig , Helmut Schettler , Thomas-Michael Winkel
- Applicant: Thomas Ludwig , Helmut Schettler , Thomas-Michael Winkel
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agent John E. Campbell
- Priority: EP07104752 20070323
- Main IPC: G01R27/04
- IPC: G01R27/04 ; G01R27/32
Abstract:
The present invention relates to a measurement arrangement for determining the characteristic line parameters by measuring the S-parameters as a function of the frequency of transmission lines. A voltage mesh and a ground mesh in a metal layer are connected symmetrically to a reference ground (RG) in the layer at all ends.
Public/Granted literature
Information query
