Invention Grant
- Patent Title: Electrical testing device
- Patent Title (中): 电气测试装置
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Application No.: US12398975Application Date: 2009-03-05
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Publication No.: US07990169B2Publication Date: 2011-08-02
- Inventor: Kim-Yeung Sip
- Applicant: Kim-Yeung Sip
- Applicant Address: CN Shenzhen, Guangdong Province TW Tu-Cheng, New Taipei
- Assignee: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- Current Assignee: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- Current Assignee Address: CN Shenzhen, Guangdong Province TW Tu-Cheng, New Taipei
- Agent Frank R. Niranjan
- Priority: CN200810303720 20080813
- Main IPC: G01R31/02
- IPC: G01R31/02 ; G01R31/28

Abstract:
An electrical testing device used for testing an electronic device under test. The electrical testing device includes a cable configured for receiving a test signal and transmitting the received test signal therethrough, and a testing unit connected to the cable and configured for analyzing the test signal. The cable includes a flexible body, a number of first connectors connected to an end of the flexible body configured for receiving a test signal from the electronic device under test, and a second connector connected to the other end of the flexible body configured for transmitting the test signal between the flexible body and the testing unit.
Public/Granted literature
- US20100039101A1 ELECTRICAL TESTING DEVICE Public/Granted day:2010-02-18
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