An automated test measurement system (ATMS) (100), for automatically measuring a device under test (DUT) (60), includes a control module (110), a signal generation module (120), an encoder module (130), and a signal analyzer module (140). The control module receives an encoder parameter and a test item, and generates a pattern command and an analyzer command according to the test item. The signal generation module generates a pattern according to the pattern command. The encoder module transforms the pattern into a bitstream according to the encoder parameter, and transmits the bitstream to the DUT. The bitstream is then transformed into a test signal. The analyzer module receives the test signal from the DUT, and analyzes the test signal according to the analyzer command. An automated test measurement method therefor is also provided.