Invention Grant
- Patent Title: Immersion exposure apparatus and device manufacturing method with liquid detection apparatus
- Patent Title (中): 浸液曝光装置及液体检测装置的装置制造方法
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Application No.: US10587268Application Date: 2005-01-28
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Publication No.: US07990516B2Publication Date: 2011-08-02
- Inventor: Hiroaki Takaiwa , Takashi Horiuchi
- Applicant: Hiroaki Takaiwa , Takashi Horiuchi
- Applicant Address: JP Tokyo
- Assignee: Nikon Corporation
- Current Assignee: Nikon Corporation
- Current Assignee Address: JP Tokyo
- Agency: Oliff & Berridge, PLC
- Priority: JP2004-026864 20040203
- International Application: PCT/JP2005/001225 WO 20050128
- International Announcement: WO2005/076321 WO 20050818
- Main IPC: G03B27/52
- IPC: G03B27/52

Abstract:
An exposure apparatus for exposing a substrate by emitting exposure light thereto through a projection optical system and liquid, has a detection apparatus that detects whether the liquid is present on an object disposed lower than a front end of the projection optical system. Another detection apparatus has an emitting portion that emits detection light to an immersion area between the projection optical system and an object disposed on an image plane side thereof, and a light-receiving portion disposed at a predetermined position for the detection light; therein, at least one of size and shape of the immersion area is obtained based on light receiving results. The detection apparatus is used to detect the presence of liquid on such lower-disposed object, the state of the immersion area, or shape or contact angle of the liquid. Optimal measures are taken, based on detection results, for maintaining high exposure and measurement accuracies.
Public/Granted literature
- US20070159609A1 Exposure apparatus and device manufacturing method Public/Granted day:2007-07-12
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