Invention Grant
US07991096B1 Data sampling method and apparatus using through-transition counts to reject worst sampling position
有权
数据采样方法和使用过渡计数的装置来排除最差采样位置
- Patent Title: Data sampling method and apparatus using through-transition counts to reject worst sampling position
- Patent Title (中): 数据采样方法和使用过渡计数的装置来排除最差采样位置
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Application No.: US10842231Application Date: 2004-05-10
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Publication No.: US07991096B1Publication Date: 2011-08-02
- Inventor: Bruce Kim , Hoon Choi , Gyudong Kim
- Applicant: Bruce Kim , Hoon Choi , Gyudong Kim
- Applicant Address: US CA Sunnyvale
- Assignee: Silicon Image, Inc.
- Current Assignee: Silicon Image, Inc.
- Current Assignee Address: US CA Sunnyvale
- Agency: Girard & Equitz LLP
- Main IPC: H04L7/00
- IPC: H04L7/00

Abstract:
A data sampling circuit that employs an oversampling clock to oversample a data signal, a phase tracking circuit for use in such a sampling circuit, and a receiver and system including such a sampling circuit. Preferably, phase tracking is implemented by systematically identifying and rejecting at least one worst sampling position, and sampling the data signal at a non-rejected sampling position. Preferably, phase tracking is accomplished by counting through-transitions of edges of the sampled data signal through each oversampling position, and rejecting an oversampling position having a highest count of through-transitions. In some embodiments, different phase tracking methods (at least one of which includes the step of generating through-transition counts) are used for different types of input data. Other aspects of the invention are methods for determining an oversampling position for oversampling a data signal, and methods for oversampling a data signal including by generating through-transition counts.
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