Invention Grant
- Patent Title: Weight inspection apparatus and weight inspection system provided therewith
- Patent Title (中): 重量检查装置和重量检查系统
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Application No.: US12519340Application Date: 2008-02-06
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Publication No.: US07991110B2Publication Date: 2011-08-02
- Inventor: Osamu Hirose
- Applicant: Osamu Hirose
- Applicant Address: JP Kyoto
- Assignee: Ishida Co., Ltd.
- Current Assignee: Ishida Co., Ltd.
- Current Assignee Address: JP Kyoto
- Agency: Global IP Counselors, LLP
- Priority: JP2007-029777 20070208
- International Application: PCT/JP2008/051949 WO 20080206
- International Announcement: WO2008/096787 WO 20080814
- Main IPC: G01B15/02
- IPC: G01B15/02

Abstract:
A weight inspection apparatus includes a weight obtaining unit, an irradiation unit, a detection unit and an estimated weight calculation unit. The weight obtaining unit is configured to obtain an actual weight of an inspection target object. The irradiation unit is configured to irradiate the inspection target object with energy waves. The detection unit is configured to detect the energy waves irradiated at the inspection target object. The estimated weight calculation unit is configured to calculate an estimated weight of the inspection target object based on a result of detection by the detection unit. The deviation amount calculation unit is configured to calculate a difference between the actual weight obtained by the weight obtaining unit and the estimated weight obtained by the estimated weight calculation unit.
Public/Granted literature
- US07860212B2 Weight inspection apparatus and weight inspection system provided therewith Public/Granted day:2010-12-28
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