Invention Grant
- Patent Title: Benchmarking diagnostic algorithms
- Patent Title (中): 基准诊断算法
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Application No.: US12104039Application Date: 2008-04-16
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Publication No.: US07991580B2Publication Date: 2011-08-02
- Inventor: Lokesh Sambasivan , Joydeb Mukherjee , Dinkar Mylaraswamy
- Applicant: Lokesh Sambasivan , Joydeb Mukherjee , Dinkar Mylaraswamy
- Applicant Address: US NJ Morristown
- Assignee: Honeywell International Inc.
- Current Assignee: Honeywell International Inc.
- Current Assignee Address: US NJ Morristown
- Agency: Ingrassia Fisher & Lorenz
- Main IPC: G06F17/18
- IPC: G06F17/18

Abstract:
A method for benchmarking diagnostic algorithms for a particular application is provided. The diagnostic algorithms are rank ordered based on a specified criterion so as to weed out weak algorithms, selecting more robust algorithms, defined in some sense, for deployment. This is realized by evaluating various parameters subsequently mentioned. A normalized product entropy ratio parameter is obtained. A performance parameter vector is fixed to define a plurality of sensitivity parameters including a plurality of threshold parameters and a plurality of data parameters. The plurality of threshold parameters and the plurality of data parameters are perturbed to obtain a threshold sensitivity parameter and a data sensitivity parameter.
Public/Granted literature
- US20090265134A1 BENCHMARKING DIAGNOSTIC ALGORITHMS Public/Granted day:2009-10-22
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