Invention Grant
US07992348B2 High-frequency measuring enclosure for measuring large test objects
有权
用于测量大型测试对象的高频测量机箱
- Patent Title: High-frequency measuring enclosure for measuring large test objects
- Patent Title (中): 用于测量大型测试对象的高频测量机箱
-
Application No.: US12095436Application Date: 2006-11-30
-
Publication No.: US07992348B2Publication Date: 2011-08-09
- Inventor: Torsten Fritzel , Hans-Juergen Steiner
- Applicant: Torsten Fritzel , Hans-Juergen Steiner
- Applicant Address: DE Taufkirchen
- Assignee: Astrium GmbH
- Current Assignee: Astrium GmbH
- Current Assignee Address: DE Taufkirchen
- Agency: Crowell & Moring LLP
- Priority: DE102005057403 20051130; DE102006056998 20061130
- International Application: PCT/EP2006/011493 WO 20061130
- International Announcement: WO2007/062839 WO 20070607
- Main IPC: G01R29/08
- IPC: G01R29/08 ; E04H5/02 ; H01Q17/00
Abstract:
A high-frequency measuring enclosure for measuring large test objects is formed by an air-supported membrane or textile construction of a spherical or ellipsoidal contour, which is substantially pervious to electromagnetic radiation. For absorption of residual electromagnetic radiation that may be reflected by the interior of the surface, the floor is covered with absorber material.
Public/Granted literature
- US20080271387A1 High-Frequency Measuring Hangar for Measuring Large Test Objects Public/Granted day:2008-11-06
Information query
