Invention Grant
- Patent Title: Electromagnetic interference testing device
- Patent Title (中): 电磁干扰测试装置
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Application No.: US12417638Application Date: 2009-04-03
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Publication No.: US07994805B2Publication Date: 2011-08-09
- Inventor: Chien-Yi Chen
- Applicant: Chien-Yi Chen
- Applicant Address: TW Tu-Cheng, New Taipei
- Assignee: Hon Hai Precision Industry Co., Ltd.
- Current Assignee: Hon Hai Precision Industry Co., Ltd.
- Current Assignee Address: TW Tu-Cheng, New Taipei
- Agent Frank R. Niranjan
- Priority: CN200810304209 20080826
- Main IPC: G01R31/00
- IPC: G01R31/00

Abstract:
A testing device includes a shielding case and a driving member opening and closing the shielding case. The shielding case includes a receiving space for receiving an electronic device therein, a cover, and a base. The driving member includes a first driving member mechanically connected to an outside of the cover of the shielding case and a second driving member mechanically connected to an outside of the base of the shielding case. The first driving member moves the cover vertically relative to the base. The second driving member moves the base horizontally relative to the cover. Movement of the shielding case in an open position allows the electronic device to be received in or removed from the shielding case. Movement of the shielding case in a closed position allows the electronic device to be tested.
Public/Granted literature
- US20100051344A1 TESTING DEVICE Public/Granted day:2010-03-04
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