Embodiments of the present disclosure relate to a system and method for testing an embedded circuit in a semiconductor arrangement as part of an overall circuit that is located on a semiconductor wafer, the system and method comprising an arrangement comprising an overall circuit with at least one input and output. The overall circuit may be provided with an embedded circuit that is not directly connected to the inputs and outputs or may be connected thereto by being specially switched. Switching elements and test islands that are connected thereto may be provided such that the input or the output of the embedded circuit may be connected to the test islands via the switching elements in case of a test. The switching elements may be switched to said test mode in case of a test by applying a voltage to the test island, or the switching elements may be switched in this manner. The arrangement may thus allow for a flexible testing system and method while the used substrate area and the number of required inputs and outputs remain low.