Invention Grant
- Patent Title: Contact insert for a microcircuit test socket
- Patent Title (中): 接触插件用于微电路测试插座
-
Application No.: US12024622Application Date: 2008-02-01
-
Publication No.: US07994808B2Publication Date: 2011-08-09
- Inventor: Patrick J. Alladio , Brian K. Warwick
- Applicant: Patrick J. Alladio , Brian K. Warwick
- Applicant Address: US MN Minneapolis
- Assignee: Johnstech International Corporation
- Current Assignee: Johnstech International Corporation
- Current Assignee Address: US MN Minneapolis
- Agency: Nawrocki, Rooney & Silvertson, P.A.
- Main IPC: G01R31/02
- IPC: G01R31/02
Abstract:
A system for testing a microcircuit having a center ground (CG) terminal has an insert for electrically connecting the CG terminal to a ground contact on a load board. The insert is held within a housing by compression and frictional interaction between a resilient projection carried by the insert and a slot in a wall of an aperture holding the insert.
Public/Granted literature
- US20080218177A1 CONTACT INSERT FOR A MICROCIRCUIT TEST SOCKET Public/Granted day:2008-09-11
Information query
