Invention Grant
- Patent Title: Dual temperature control circuit
- Patent Title (中): 双温控电路
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Application No.: US12767689Application Date: 2010-04-26
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Publication No.: US07994841B2Publication Date: 2011-08-09
- Inventor: Fei Chen , Wu-Kui Li
- Applicant: Fei Chen , Wu-Kui Li
- Applicant Address: CN Shanghai TW Tu-Cheng, New Taipei
- Assignee: Ambit Microsystems (Shanghai) Ltd.,Hon Hai Precision Industry Co., Ltd.
- Current Assignee: Ambit Microsystems (Shanghai) Ltd.,Hon Hai Precision Industry Co., Ltd.
- Current Assignee Address: CN Shanghai TW Tu-Cheng, New Taipei
- Agent Raymond J. Chew
- Priority: CN200920303439 20090521
- Main IPC: G05F1/10
- IPC: G05F1/10

Abstract:
A dual temperature control circuit detects a first temperature of a first location and a second temperature of a second location. The dual temperature control circuit transforms the first temperature to a first voltage signal, and transforms the second temperature to a second voltage signal, and compares the first voltage signal and the second voltage signal to output a third voltage signal, where a controlled circuit is controlled according to the third voltage signal.
Public/Granted literature
- US20100295603A1 DUAL TEMPERATURE CONTROL CIRCUIT Public/Granted day:2010-11-25
Information query
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