Invention Grant
- Patent Title: Systems and methods for thermally-induced aberration correction in immersion lithography
- Patent Title (中): 浸没光刻中热致像差校正的系统和方法
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Application No.: US11634924Application Date: 2006-12-07
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Publication No.: US07995185B2Publication Date: 2011-08-09
- Inventor: Harry Sewell , Louis John Markoya , Diane Czop McCafferty
- Applicant: Harry Sewell , Louis John Markoya , Diane Czop McCafferty
- Applicant Address: NL Veldhoven
- Assignee: ASML Holding N.V.
- Current Assignee: ASML Holding N.V.
- Current Assignee Address: NL Veldhoven
- Agency: Sterne, Kessler, Goldstein & Fox P.L.L.C.
- Main IPC: G03B27/52
- IPC: G03B27/52

Abstract:
Immersion lithography aberration control systems and methods that compensate for a heating effect of exposure energy in an immersion fluid across an exposure zone are provided. An aberration control system includes actuators that adjust optical elements within the immersion lithography system and a fluid heating compensation module coupled to the actuators. The fluid heating adjustment module determines actuator commands to make aberration adjustments to optical elements within the immersion lithography system based on changes in one or more of a flow rate of the immersion liquid, an exposure dose and a reticle pattern image. In an embodiment, the aberration control system includes an interferometric sensor that pre-calibrates aberrations based on changes in operating characteristics related to the immersion fluid. Methods are provided that calibrate aberrations, determine actuator adjustments and implement actuator adjustments upon changes in operating characteristics to control aberration effects.
Public/Granted literature
- US20080137044A1 Systems and methods for thermally-induced aberration correction in immersion lithography Public/Granted day:2008-06-12
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