Invention Grant
US07995301B2 Method and apparatus for determining a location of a defect on a storage medium
有权
用于确定存储介质上的缺陷的位置的方法和装置
- Patent Title: Method and apparatus for determining a location of a defect on a storage medium
- Patent Title (中): 用于确定存储介质上的缺陷的位置的方法和装置
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Application No.: US12684659Application Date: 2010-01-08
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Publication No.: US07995301B2Publication Date: 2011-08-09
- Inventor: Mats Oberg
- Applicant: Mats Oberg
- Applicant Address: BB St. Michael
- Assignee: Marvell World Trade Ltd.
- Current Assignee: Marvell World Trade Ltd.
- Current Assignee Address: BB St. Michael
- Main IPC: G11B15/18
- IPC: G11B15/18

Abstract:
A defect is detected on a storage medium of a disk drive. A location of the defect is determined, within a smallest addressable unit of data stored on the storage medium. An indication of the location is stored in a memory. A location of a sensor of the disk drive relative to the data stored on the storage medium is monitored. A response of at least one of a defect detector of the disk drive, a read channel controller of the disk drive, and a servo controller of the disk drive is changed based on the location of the sensor relative to the data stored on the storage medium and the stored indication of the location of the defect.
Public/Granted literature
- US20100177428A1 Method and Apparatus for Determining a Location of a Defect on a Storage Medium Public/Granted day:2010-07-15
Information query
IPC分类: